@incollection{,
	
					
					
					8369571B7D7FB5F119BAD73288C17DB5
				,
	author={{K.L.V.RamanaKumari} and {M. AshaRani} and {N.Balaji}},
	journal={{Global Journal of Computer Science and Technology}},
	journal={{GJCST}}0975-41720975-435010.34257/gjcst,
	address={Cambridge, United States},
	publisher={Global Journals Organisation}18316
}

@book{b0,
	
	
		,
	title={{Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits}}
		,
	author={{
			DAMichael Lee
		} and {
			VishwaniDBushnell
		} and {
			Agrawal
		}}
		
		
		
			,
	year={2002}
			,
	publisher={Kluwer Academic Publishers}
			,
	address={New York}
		
	
	,
	note={2nd ed.}

}

@book{b1,
	
	
		,
	author={{
			MAMiron Abramovici
		} and {
			MelvinABreuer
		} and {
			ArthurDFriedmaan
		}}
		
		
		,
	title={{Digital Systems Testing and Testable Design}}
				
			,
	publisher={Jaico Publishing House}
			,
	year={2002}
		
	

}

@incollection{b2,
	
	
		,
	title={{Neighborhood pattern-sensitive fault testing and diagnostics for random access memories}}
		,
	author={{
			K.-LCheng
		} and {
			M.-FTsai
		} and {
			C.-WWu
		}}
		
		
	
	
		,
	journal={{IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems}}
		
			21
			11
			
			,
	year={Nov. 2002}
		
	

}

@book{b3,
	
	
		,
	title={{Testing Semiconductor Memories: Theory and Practice}}
		,
	author={{
			AJVandegoor
		}}
		
			,
	year={1991}
			,
	publisher={John Wiley & Sons}
			,
	address={Chichester, England}
		
	

}

@book{b4,
	
	
		,
	title={{Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories Yu-Jen Huang and Jin-Fu Li Advanced Reliable Systems (ARES) Laboratory, Proceedings of the Eleventh IEEE European Test Symposium}}
				
	

}

@incollection{b5,
	
	
		,
	title={{Implementation of Random Number Generator Using LFSR for High Secured Multi Purpose Applications}}
	
	
		,
	journal={{International Journal of Computer Science and Information Technologies}}
		
			3
			1
			
			,
	year={2012}
		
	

}

@book{b6,
	
	
		,
	author={{
			AJVan De Goor
		}}
		,
	title={{Testing Semiconductor Memories: Theory and Practice}}
				Chichester, England
		
			,
	publisher={John Wiley & Son}
			,
	year={1991}
		
	

}

@incollection{b7,
	
	
		,
	title={{Neighborhood Pattern Sensitive Fault Testing and Diagnostics for Random-Access Memories}}
		,
	author={{
			KLCheng
		} and {
			MTsai
		} and {
			CWWu
		}}
		
		
	
	
		,
	journal={{IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems}}
		
			,
	year={Nov. 2002}
		
	

}

@incollection{b8,
	
	
		,
	title={{Efficient neighborhood pattern sensitive fault test algorithms for semiconductor memories}}
		,
	author={{
			KCheng
		} and {
			C.-WWu
		}}
		
	
	
		,
	booktitle={{Proc. IEEE VLSI Test Symp(VTS)}}
				IEEE VLSI Test Symp(VTS)Marina Del Rey, California
		
			,
	year={Apr 2001}
			
		
	

}

@incollection{b9,
	
	
		,
	title={{Multi Background Memory Testing}}
		,
	author={{
			SVYarmolik
		} and {
			Mrozek
		}}
		
	
	
		,
	booktitle={{Proc. Th MIXDES 14 International Conference}}
				Th MIXDES 14 International ConferenceCiechocinek, Poland
		
			,
	year={June 2000}
		
	

}

@book{b10,
	
	
		,
	title={{}}
		,
	author={{
			DdrNexys4
		} and {
			Fpga
		} and {
			User Guide
		}}
		
		
		
	
	,
	note={in xilinx provided web page}

}

@incollection{b11,
	
	
		,
	title={{FPGA implementation of memory design and testing}}
		,
	author={{
			KL VRamana Kumari
		} and {
			AshaRani
		} and {
			Balaji
		}}
		
		
	
	
		,
	booktitle={{2017 IEEE 7 th International Advance Computing Conference}}
				
	

}