RAJESHWARI SOMA; ZULEKHA TABASSUM; S.PRATHAP. An On-Chip Delay Measurement Technique for Small-Delay Defect Detection using Signature Registers. Global Journal of Computer Science and Technology, [S. l.], v. 13, n. C10, p. 21–28, 2013. Disponível em: https://computerresearch.org/index.php/computer/article/view/280. Acesso em: 3 may. 2024.