Rajeshwari Soma, Zulekha Tabassum and S.Prathap (2013) “An On-Chip Delay Measurement Technique for Small-Delay Defect Detection using Signature Registers”, Global Journal of Computer Science and Technology, 13(C10), pp. 21–28. Available at: https://computerresearch.org/index.php/computer/article/view/280 (Accessed: 3 May 2024).